How to lie with statistics / by Darrell Huff ; illustrated by Irving Geis.
Material type:
TextLanguage: English Publisher: New York : Norton, 1993Description: 144 páginas : ilustraciones ; 21 cmContent type: texto Media type: sin mediación Carrier type: volumenISBN: 9780393310726Subject(s): Estadística matemática -- Crítica e interpretación | Ciencias sociales | Estadística -- Crítica e interpretaciónDDC classification: 519.5 | Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Libros
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General | 519.5 / H889h 1993 (Browse shelf(Opens below)) | Ej. 1 | Available | 7110001739 |
Incluye índice.
Acknowledgments ; Introduction ; The Sample with the built-in bias ; The Well-chosen average ; The Little figures that are not there ; Much ado about practically nothing ; The Gee-whiz graph ; The One-dimensional picture ; The Semiattached figure ; Post hoc rides again ; How to statisticulate ; How to talk back to a statistic. .
Darrell Huff runs the gamut of every popularly used type of statistic, probes such things as the sample study, the tabulation method, the interview technique, or the way the results are derived from the figures, and points up the countless number of dodges which are used to fool rather than inform.
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